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LMG3526R030中文資料德州儀器數(shù)據(jù)手冊(cè)PDF規(guī)格書(shū)

LMG3526R030
廠商型號(hào)

LMG3526R030

功能描述

LMG3526R030 650-V 30-mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting

文件大小

3.32567 Mbytes

頁(yè)面數(shù)量

51 頁(yè)

生產(chǎn)廠商 Texas Instruments
企業(yè)簡(jiǎn)稱

TI德州儀器

中文名稱

美國(guó)德州儀器公司官網(wǎng)

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更新時(shí)間

2025-1-21 18:21:00

LMG3526R030規(guī)格書(shū)詳情

1 Features

? 650-V GaN-on-Si FET with integrated gate driver

– Integrated high precision gate bias voltage

– 200-V/ns FET hold-off

– 2-MHz switching frequency

– 20-V/ns to 150-V/ns slew rate for optimization

of switching performance and EMI mitigation

– Operates from 7.5-V to 18-V supply

? Robust protection

– Cycle-by-cycle overcurrent and latched shortcircuit

protection with < 100-ns response

– Withstands 720-V surge while hard-switching

– Self-protection from internal overtemperature

and UVLO monitoring

? Advanced power management

– Digital temperature PWM output

? Top-side cooled 12-mm × 12-mm VQFN package

separates electrical and thermal paths for lowest

power loop inductance

? Zero voltage detection feature that facilitates softswitching

converters

2 Applications

? Switch-mode power converters

? Merchant network and server PSU

? Merchant telecom rectifiers

? Solar inverters and industrial motor drives

? Uninterruptable power supplies

3 Description

The LMG3526R030 GaN FET with integrated driver

and protections is targeting switch-mode power

converters and enables designers to achieve new

levels of power density and efficiency.

The LMG3526R030 integrates a silicon driver that

enables switching speed up to 150 V/ns. TI’s

integrated precision gate bias results in higher

switching SOA compared to discrete silicon gate

drivers. This integration, combined with TI's lowinductance

package, delivers clean switching and

minimal ringing in hard-switching power supply

topologies. Adjustable gate drive strength allows

control of the slew rate from 20 V/ns to 150 V/ns,

which can be used to actively control EMI and

optimize switching performance.

Advanced features include digital temperature

reporting, fault detection and zero voltage detection.

The temperature of the GaN FET is reported through

a variable duty cycle PWM output. Faults reported

include overtemperature, overcurrent, and UVLO

monitoring. Zero-voltage detection (ZVD) feature can

provide a pulse output from ZVD pin when zerovoltage

switching is realized.

供應(yīng)商 型號(hào) 品牌 批號(hào) 封裝 庫(kù)存 備注 價(jià)格
TI(德州儀器)
10000
原裝正品現(xiàn)貨庫(kù)存價(jià)優(yōu)
詢價(jià)
TexasI
23+
NA
6954
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TI
24+
SMD
15600
門(mén)驅(qū)動(dòng)器
詢價(jià)
TI(德州儀器)
23+
NA
20094
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詢價(jià)
TI/德州儀器
22+
QFM-9
13000
原裝正品
詢價(jià)
TI
24+
52-VQFN
17024
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Texas Instruments
23+/24+
52-VQFN
8600
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原廠正品
23+
DIP16
5000
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TI(德州儀器)
2021+
8000
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詢價(jià)
TI/德州儀器
22+
QFM-9
9600
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詢價(jià)