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LMC6001BINSLASHNOPB.A中文資料德州儀器數(shù)據(jù)手冊(cè)PDF規(guī)格書

LMC6001BINSLASHNOPB.A
廠商型號(hào)

LMC6001BINSLASHNOPB.A

功能描述

LMC6001 Ultra, Ultra-Low Input Current Amplifier

絲印標(biāo)識(shí)

LMC6001BIN

封裝外殼

PDIP

文件大小

680.35 Kbytes

頁面數(shù)量

26

生產(chǎn)廠商 Texas Instruments
企業(yè)簡(jiǎn)稱

TI2德州儀器

中文名稱

美國德州儀器公司官網(wǎng)

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更新時(shí)間

2025-7-21 18:34:00

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LMC6001BINSLASHNOPB.A規(guī)格書詳情

1 Features

1? (Maximum Limit, 25°C Unless Otherwise Noted)

? Input Current (100% Tested): 25 fA

? Input Current Over Temperature: 2 pA

? Low Power: 750 μA

? Low VOS: 350 μV

? Low Noise: 22 nV/√Hz at 1 kHz Typical

2 Applications

? Electrometer Amplifiers

? Photodiode Preamplifiers

? Ion Detectors

? A.T.E. Leakage Testing

3 Description

Featuring 100% tested input currents of 25 fA

maximum, low operating power, and ESD protection

of 2000 V, the LMC6001 device achieves a new

industry benchmark for low input current operational

amplifiers. By tightly controlling the molding

compound, Texas Instruments is able to offer this

ultra-low input current in a lower cost molded

package.

To avoid long turnon settling times common in other

low input current op amps, the LMC6001A is tested

three times in the first minute of operation. Even units

that meet the 25-fA limit are rejected if they drift.

Because of the ultra-low input current noise of 0.13

fA/√Hz, the LMC6001 can provide almost noiseless

amplification of high resistance signal sources.

Adding only 1 dB at 100 kΩ, 0.1 dB at 1 MΩ and 0.01 dB or less from 10 MΩ to 2,000 MΩ, the LMC6001 is

an almost noiseless amplifier.

The LMC6001 is ideally suited for electrometer applications requiring ultra-low input leakage such as

sensitive photodetection transimpedance amplifiers

and sensor amplifiers. Because input referred noise is

only 22 nV/√Hz, the LMC6001 can achieve higher signal to noise ratio than JFET input type

electrometer amplifiers. Other applications of the LMC6001 include long interval integrators, ultra-high

input impedance instrumentation amplifiers, and

sensitive electrical-field measurement circuits.

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