EVAL-AD5570EB開發(fā)板套件編程器的評估板-數(shù)模轉(zhuǎn)換器（DAC）規(guī)格書PDF中文資料

EVAL-AD5570EB屬于開發(fā)板套件編程器的評估板-數(shù)模轉(zhuǎn)換器（DAC）。由亞德諾半導體技術(shù)有限公司制造生產(chǎn)的EVAL-AD5570EB評估板 - 數(shù)模轉(zhuǎn)換器（DAC）該系列產(chǎn)品提供了一種方便的方法，在經(jīng)過驗證的設(shè)計環(huán)境中對用于將數(shù)字數(shù)據(jù)轉(zhuǎn)換為模擬格式的器件進行性能或特性評估。重點器件涵蓋范圍從以適合學生或愛好者使用的方式實現(xiàn)的適度功能器件，到適合電信基礎(chǔ)設(shè)施應用的高級器件。

GENERAL DESCRIPTION

The AD5570 is a single 16-bit serial input, voltage output DAC that operates from supply voltages of ±11.4 V up to ±16.5 V. Integral linearity (INL) and differential nonlinearity (DNL) are accurate to 1 LSB. During power-up, when the supply voltages are changing, VOUT is clamped to 0 V via a low impedance path.

FEATURES

Full 16-bit performance

1 LSB maximum INL and DNL

Output voltage range up to ±14 V

On-board reference buffers, eliminating the need for a

negative reference

Controlled output during power-on

Temperature ranges of ?40°C to +85°C for A/B version/?40°C

to +125°C for W/Y version

Settling time of 10 μs to 0.003

Clear function to 0 V

Asynchronous update of outputs (LDAC pin)

Power-on reset

Serial data output for daisy chaining

Data readback facility

5 kV HBM ESD classification

APPLICATIONS

Industrial automation

Automatic test equipment

Process control

Data acquisition systems

General-purpose instrumentation