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C2955中文資料濱松光子數(shù)據(jù)手冊(cè)PDF規(guī)格書

C2955
廠商型號(hào)

C2955

功能描述

INFRARED IC INTERNAL INSPECTION SYSTEM

文件大小

67.31 Kbytes

頁面數(shù)量

2

生產(chǎn)廠商 Hamamatsu Photonics Co.,Ltd.
企業(yè)簡(jiǎn)稱

HAMAMATSU濱松光子

中文名稱

濱松光子學(xué)株式會(huì)社官網(wǎng)

原廠標(biāo)識(shí)
數(shù)據(jù)手冊(cè)

下載地址一下載地址二

更新時(shí)間

2025-1-29 20:56:00

C2955規(guī)格書詳情

The C2955 is an IC internal inspection system incorporating an infrared microscope and an infrared CCD camera. Use of a newly developed infrared CCD camera enables a high sensitivity approximately ten times that of conventional systems (in comparisons by HAMAMATSU), at a wavelength of 1.0 μm, making it possible to obtain sharp, clear images with high resolution.

● Best suited for flip-chip evaluation

● No damage to part under observation

● High sensitivity, high resolution

● Built-in contrast enhancement function

● Shading correction function

APPLICATIONS

? Inspection of flip-chip and other packaged IC devices

? Testing for abnormalities (defects, failures) in metal and polysilicon wiring

? Observation of wire bonding

? Observation of various types of die bonding zones

? Simultaneous inspection of Al-Si nodules and multiple patterns

? Observation of pattern diffusion into substrate

? Identification of ESD failure locations

產(chǎn)品屬性

  • 型號(hào):

    C2955

  • 制造商:

    HAMAMATSU

  • 制造商全稱:

    Hamamatsu Corporation

  • 功能描述:

    INFRARED IC INTERNAL INSPECTION SYSTEM

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