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AFEX8201中文資料德州儀器數(shù)據(jù)手冊PDF規(guī)格書

AFEX8201
廠商型號

AFEX8201

功能描述

AFEx8201 16-Bit and 14-Bit Digital-to-Analog Converters (DACs) With Voltage Reference and Diagnostic ADC for Low-Power Applications

文件大小

3.89641 Mbytes

頁面數(shù)量

95

生產(chǎn)廠商 Texas Instruments
企業(yè)簡稱

TI德州儀器

中文名稱

美國德州儀器公司官網(wǎng)

原廠標(biāo)識
數(shù)據(jù)手冊

下載地址一下載地址二到原廠下載

更新時間

2025-1-1 16:42:00

AFEX8201規(guī)格書詳情

1 Features

? Functional Safety-Capable

– Documentation available to aid functional safety

system design

? Low quiescent current: 170 μA (typical), 210 μA

(maximum)

? 16-bit or 14-bit monotonic high-performance DAC

– DAC output range: 0 V to 2.5 V

– Digital DAC slew-rate control

– 4-LSB INL at 16 bits

– 0.07 FSR (max) TUE from –40°C to +125°C

? 12-bit 3.84-kSPS ADC for advanced diagnostics

? Integrated 1.25-V reference at 10 ppm/°C (max)

? Internal 1.2288-MHz oscillator with clock output

? Digital interfaces:

– Serial peripheral interface (SPI)

– Universal asynchronous receiver-transmitter

(UART)

? Fault detection: CRC bit error checking, windowed

watchdog timer, diagnostic ADC

? Wide operating temperature: –55°C to +125°C

2 Applications

? Process control and industrial automation

? PLC or DCS I/O modules

? 3-wire and 4-wire transmitters

? 4-mA to 20-mA loop-powered applications

3 Description

The 16-bit AFE88201 and 14-bit AFE78201

(AFEx8201) are highly-integrated, high-accuracy,

extremely low-power digital-to-analog converters

(DACs) with voltage outputs designed for processcontrol

and industrial-automation applications.

The AFEx8201 devices include most of the

components required to design a 4?mA to 20?mA,

3?wire or 4-wire sensor transmitter or analog output

module. In addition to the highly accurate DAC, the

AFEx8201 incorporate a 10-ppm/°C voltage reference

and diagnostic analog-to-digital converter (ADC).

To accommodate intrinsic and functional-safety

concerns, external voltage-to-current conversion and

power-regulation are required.

The internal diagnostic ADC is multiplexed to

several internal nodes that enable an automatic selfhealth

check. This check is capable of detecting

errors or malfunctions of the internal bias sources,

power regulator, voltage reference, DAC output, die

temperature, and optional external voltage source. If

any fault is detected from the diagnostic ADC, CRC

frame-error checking, or windowed watchdog timer,

the devices can optionally issue an interrupt, enter a

user-specified fail-safe state, or both.

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